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Real-time monitoring of InAs QD growth procedure on InP substrate by spectral reflectance

โœ Scribed by E. Ahn; K. Park; B. Kim; Y.D. Kim; E. Yoon


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
278 KB
Volume
255
Category
Article
ISSN
0169-4332

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