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Reaction layers around SiC particles in Ti: an electron microscopy study

✍ Scribed by B.J. Kooi; M. Kabel; A.B. Kloosterman; J.Th.M. De Hosson

Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 494 KB
Volume: 47
Category: Article
ISSN: 1359-6454
DOI: 10.1016/s1359-6454(99)00151-2

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