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Electron microscopy of reaction layers between SiC and Ti–6Al–4V after laser embedding

✍ Scribed by A.B. Kloosterman; B.J. Kooi; J.Th.M. De Hosson

Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 784 KB
Volume: 46
Category: Article
ISSN: 1359-6454
DOI: 10.1016/s1359-6454(98)00265-1

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