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RBS study of epitaxially grown thin films of the double perovskite La2NiMnO6

✍ Scribed by S. Budak; C. Muntele; I. Muntele; H. Guo; A. Gupta; D. Ila

Book ID: 103862299
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 397 KB
Volume: 261
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2007.04.166

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✦ Synopsis

Epitaxial thin films of La 2 NiMnO 6 , a ferromagnetic semiconductor, have been fabricated on different substrates by pulsed laser deposition (PLD) [H. Guo, J. Burgess, S. Street, A. Gupta, T.G. Calvarese, M.A. Subramanian, Appl. Phys. Lett. 89 (2006) 0225509]. X-ray diffraction and Raman scattering observations show that the films are single crystalline and have an orthorhombic structure. Rutherford backscattering spectrometry (RBS) measurements were done on four different samples using 2.1 MeV He + ions. We used RUMP simulation on the RBS data to extract information about the thickness and stoichiometry of the layers. In this paper, we are discussing the differences of the various films investigated.

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