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RBS and XHRTEM characterization of epitaxial Ni films prepared by biased d.c. sputter deposition on MgO(001)

✍ Scribed by Hisashi Nakai; Hong Qiu; Miklós Adamik; Gyórgy Sáfran; Péter B. Barna; Mituru Hashimoto


Book ID
107864683
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
308 KB
Volume
263
Category
Article
ISSN
0040-6090

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