FMR, XRD and XHRTEM characterization of stresses in an epitaxial Ni–Cu film prepared on MgO(001) by d.c. biased plasma sputter deposition

✍ Scribed by Hiroko Maruyama; Hong Qiu; Mituri Hashimoto; Kazuyoshi Fudaba; Hisashi Nakai; Arpad Barna; Peter B Barna

• Book ID: 108389028
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 283 KB
• Volume: 299
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/s0040-6090(96)09394-7