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RBS and NRA analyses of lithium inserted amorphous Li1+xNiVO4 films

✍ Scribed by M.V. Reddy; B. Pecquenard; P. Vinatier; C. Wannek; A. Levasseur; P. Moretto

Book ID
104068733
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
316 KB
Volume
246
Category
Article
ISSN
0168-583X

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✦ Synopsis

rf-Magnetron sputtered LiNiVO 4 thin film was used as a negative electrode for lithium microbatteries applications. Their film composition and thickness were analyzed by Rutherford backscattering spectroscopy (RBS) and nuclear reaction analysis (NRA) technique by using 4 He + , 7 Li(p a) 4 He reaction respectively. The structure, surface roughness and homogeneity of these films have been investigated by X-ray diffraction (XRD), atomic force microscopy (AFM) and auger electron spectroscopy (AES) techniques. The amount of lithium inserted into the LiNiVO 4 films was analyzed by RBS and NRA studies. The results are comparable to those obtained from the electroanalytical technique (galvanostatic method), indicating that ion beam techniques are complementary tools for the analysis of lithium metal oxide thin films.

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