RBS and AES depth profiles of Pd deposited on Si after annealing at different temperatures

✍ Scribed by M. Clement; J. M. Sanz; A. Climent; J. M. Martinez-Duart

• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 469 KB
• Volume: 12
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/sia.740120603