𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Rapid and accurate analyses of silicon and phosphorus in plants using a portable X-ray fluorescence spectrometer

✍ Scribed by Stefan Reidinger; Michael H. Ramsey; Susan E. Hartley


Book ID
115259477
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
414 KB
Volume
195
Category
Article
ISSN
0028-646X

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## X-ray fluorescence (XRF) analysis is a non-destructive technique widely used in the study of works of art. It can detect elements having atomic number >15 (phosphorus) and supplies only semiquatitative results, yet it can be helpful in a very wide range of applications. The ENEA Unit for the Saf