๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Random pattern testable design with partial circuit duplication and IDDQ testing

โœ Scribed by Hiroshi Yokoyama; Xiaoqing Wen; Hideo Tamamoto


Book ID
101298028
Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
324 KB
Volume
30
Category
Article
ISSN
0882-1666

No coin nor oath required. For personal study only.


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