Random pattern testable design with partial circuit duplication and IDDQ testing

✍ Scribed by Hiroshi Yokoyama; Xiaoqing Wen; Hideo Tamamoto

• Book ID: 101298028
• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 324 KB
• Volume: 30
• Category: Article
• ISSN: 0882-1666
• DOI: 10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o