✦ LIBER ✦
Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits
✍ Scribed by Huy Nguyen; Rabindra Roy; Abhijit Chatterjee
- Book ID
- 110262987
- Publisher
- Springer US
- Year
- 1999
- Tongue
- English
- Weight
- 118 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0923-8174
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