✦ LIBER ✦

Random-like testing of very large scale integration circuit

✍ Scribed by Shiyi Xu

Book ID: 107483030
Publisher: Chinese Electronic Periodical Services
Year: 1998
Tongue: English
Weight: 369 KB
Volume: 2
Category: Article
ISSN: 1007-6417
DOI: 10.1007/s11741-998-0040-x

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