4932028 Error log system for self-testing in very large scale integrated circuit (VLSI) units

✍ Scribed by Haluk Katircioglu; JohnA De Beule; Debaditya Mukherjee; GaryC Whitlock

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 86 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90267-b