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Raman studies of the thermal oxide of silicon

✍ Scribed by F.L. Galeener; J.C. Mikkelsen Jr.

Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 415 KB
Volume: 37
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(81)91085-1

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