Raman shift on n-doped amorphous carbon thin films grown by electron beam evaporation

✍ Scribed by Rebollo P., B. ;Freire L., F. ;Lozada M., R. ;Palomino M., R. ;Jiménez S., S. ;Zelaya A., O.

• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 176 KB
• Volume: 204
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200675206

✦ Synopsis

Abstract

The structural properties of carbon thin films synthesized under an atmosphere of nitrogen by means of electron beam evaporation were studied by Raman scattering spectroscopy. The electron beam evaporation technique is an important alternative to grown layers of this material with interesting structural properties. The observed shift of the Raman G band shows that the structure of the films tends to become more graphitic upon the increase of the deposition time. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)