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Raman scattering and XRD analysis in argon ion implanted CdS thin films prepared by vacuum evaporation

✍ Scribed by K Senthil; D Mangalaraj; Sa.K Narayandass; R Kesavamoorthy; G.L.N Reddy

Book ID: 114164357
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 207 KB
Volume: 173
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(00)00409-2

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