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Raman scattering and photoluminescence characterization of Ge/Si strained-layer superlattices grown by phase-locked epitaxy

✍ Scribed by H. Okumura; K. Miki; K. Sakamoto; T. Sakamoto; K. Endo; S. Yoshida

Book ID: 107925725
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 394 KB
Volume: 41-42
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90120-7

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