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Raman microprobe assessment of low-pressure chemical vapor deposition-grown 4HSiC epilayers

✍ Scribed by C.C. Tin; R. Hu; J. Liu; Y. Vohra; Z.C. Feng


Book ID
103169193
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
359 KB
Volume
158
Category
Article
ISSN
0022-0248

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