Raman characterization of germanium nanocrystals in amorphous silicon oxide films synthesized by rapid thermal annealing

✍ Scribed by Choi, W. K.; Ng, V.; Ng, S. P.; Thio, H. H.; Shen, Z. X.; Li, W. S.

• Book ID: 118155064
• Publisher: American Institute of Physics
• Year: 1999
• Tongue: English
• Weight: 565 KB
• Volume: 86
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.370901