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Raman and ellipsometric characterization of hydrogenated amorphous silicon thin films

โœ Scribed by NaiMan Liao; Wei Li; YueJun Kuang; YaDong Jiang; ShiBin Li; ZhiMing Wu; KangCheng Qi


Book ID
107356109
Publisher
SP Science China Press
Year
2008
Tongue
English
Weight
541 KB
Volume
52
Category
Article
ISSN
1006-9321

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