X-ray absorption study of light emitting
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N. Daldosso; G. Dalba; R. Grisenti; L. Dal Negro; L. Pavesi; F. Rocca; F. Priolo
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Article
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2003
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Elsevier Science
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English
⚖ 109 KB
X-ray absorption spectra obtained by total electron yield (TEY) at the Si absorption K-edge have been measured to have chemical and structural information about Si nanocrystals (Si-nc) produced by plasma-enhanced chemical vapour deposition (PECVD). The TEY technique has been employed to investigate