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Radiofrequency dielectric properties of amorphous semiconducting Y–Ba–Cu–O oxide thin films for bolometric detection

✍ Scribed by Aurélie Gensbittel; Olivier Dubrunfaut; Vishal S. Jagtap; Alain J. Kreisler; Annick F. Dégardin


Book ID
113937435
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
563 KB
Volume
520
Category
Article
ISSN
0040-6090

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