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Radiation Testing of the CMOS 8085 Microprocessor Family

✍ Scribed by Sexton, F. W.; Anderson, R. E.; Corbett, W. T.; Giddings, A. E.; Jorgensen, J. L.; Kim, W. S.; Mnich, T. M.; Nordstrom, T. V.; Ochoa, A.; Sobolewski, M. A.; Treece, R. K.; Wrobel, T. F.

Book ID: 114662872
Publisher: IEEE
Year: 1983
Tongue: English
Weight: 953 KB
Volume: 30
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1983.4333114

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