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Radiation hardness studies on CMOS monolithic pixel sensors

✍ Scribed by Marco Battaglia; Dario Bisello; Devis Contarato; Peter Denes; Dionisio Doering; Piero Giubilato; Tae Sung Kim; Serena Mattiazzo; Velimir Radmilovic; Sarah Zalusky

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 232 KB
Volume: 624
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2010.03.156

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