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Radiation hardness of punch-through and FET biased silicon microstrip detectors

✍ Scribed by Trond I. Westgaard; Berit S. Avset; Niaz N. Ahmed; Lars Evensen


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
408 KB
Volume
377
Category
Article
ISSN
0168-9002

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