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Measurements of transistors and silicon microstrip detector readout circuits in the Harris AVLSIRA rad-hard CMOS process

✍ Scribed by M. Raymond; G. Hall; M. Millmore; R. Sachdeva; M. French; E. Nygård; K. Yoshioka


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
829 KB
Volume
351
Category
Article
ISSN
0168-9002

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