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Radiation hardness of graded-gap AlxGa1−xAs X-ray detectors

✍ Scribed by A. Silenas; L. Dapkus; K. Pozela; J. Pozela; V. Juciene; V. Jasutis


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
190 KB
Volume
546
Category
Article
ISSN
0168-9002

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High resolution X-ray diffraction reciprocal space mapping (RSM) is used to study the crystal quality of step-graded In x Ga 1 À x As buffer layers grown on GaAs (0 0 1) substrates by molecular beam epitaxy (MBE) using two growth methods. The lateral correlation length of the buffer layers are descr