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Radiation hardness of different silicon materials after high-energy electron irradiation

✍ Scribed by S. Dittongo; L. Bosisio; M. Ciacchi; D. Contarato; G. D'Auria; E. Fretwurst; G. Lindström


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
249 KB
Volume
530
Category
Article
ISSN
0168-9002

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## Abstract The quantitative characterization of complex microdefect structures in silicon crystals grown by Czochralski method and irradiated with various doses of high‐energy electrons (18 MeV) has been performed by methods of the high‐resolution X‐ray diffraction. The concentrations and average