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Radiation Effects on the Current Densities of Integrated Injection Logic (I2L) Devices

✍ Scribed by Yang, N. T.; Chou, H. K.; Ragonese, L. J.

Book ID: 114661703
Publisher: IEEE
Year: 1978
Tongue: English
Weight: 614 KB
Volume: 25
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1978.4329589

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