Radiation and injection effects on metal-oxide-semiconductor devices using the gate-controlled-diode technique

✍ Scribed by Palumbo, Felix; Faigon, Adrian N.; Campabadal, Francesca

• Book ID: 121531521
• Publisher: American Institute of Physics
• Year: 2004
• Tongue: English
• Weight: 266 KB
• Volume: 96
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1808903