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Radiation effects on SOI analog devices parameters

✍ Scribed by Flament, O.; Leray, J.L.; Martin, J.L.; Montaron, J.; Raffaelli, M.; Blanc, J.P.; Delevoye, E.; Gautier, J.; Pelloie, J.L.; de Poncharra, J.

Book ID: 111863806
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 597 KB
Volume: 41
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.299800

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