Radiation effects on bipolar junction tr
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Chaoming Liu; Xingji Li; Hongbin Geng; Zhiming Zhao; Dezhuang Yang; Shiyu He
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Article
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2010
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Elsevier Science
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English
⚖ 791 KB
The characteristic degradation in silicon NPN bipolar junction transistors (BJTs) of 3DG112 type is examined under the irradiation with 25 MeV carbon (C) ions and various bias conditions. Different electrical parameters were measured in-situ during the exposure under each bias condition. From the ex