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Radiation effects on silicon bipolar transistors caused by 3–10 MeV protons and 20–60 MeV bromine ions

✍ Scribed by Xingji Li; Hongbin Geng; Mujie Lan; Chaoming Liu; Dezhuang Yang; Shiyu He


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
369 KB
Volume
405
Category
Article
ISSN
0921-4526

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Radiation effects on bipolar junction tr
✍ Chaoming Liu; Xingji Li; Hongbin Geng; Zhiming Zhao; Dezhuang Yang; Shiyu He 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 791 KB

The characteristic degradation in silicon NPN bipolar junction transistors (BJTs) of 3DG112 type is examined under the irradiation with 25 MeV carbon (C) ions and various bias conditions. Different electrical parameters were measured in-situ during the exposure under each bias condition. From the ex