Radiation Effects Modeling and Experimental Data on I2L Devices

✍ Scribed by Long, D. M.; Repper, C. J.; Ragonese, L. J.; Yang, Neng-Tze

• Book ID: 117929886
• Publisher: IEEE
• Year: 1976
• Tongue: English
• Weight: 928 KB
• Volume: 23
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1976.4328564