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Radiation damage studies on MCz and standard and oxygen enriched epitaxial silicon devices

✍ Scribed by E. Fretwurst; F. Hönniger; G. Kramberger; G. Lindström; I. Pintilie; R. Röder

Book ID: 108223354
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 423 KB
Volume: 583
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2007.08.194

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