Bulk damage effects in standard and oxygen-enriched silicon detectors induced by 60Co-gamma radiation

✍ Scribed by E Fretwurst; G Lindström; J Stahl; I Pintilie; Z Li; J Kierstead; E Verbitskaya; R Röder

• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 270 KB
• Volume: 514
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2003.08.077