Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs

✍ Scribed by Nazar, Gabriel L.; Rech, Paolo; Frost, Christopher; Carro, Luigi

• Book ID: 120825560
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 609 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2013.2261319