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Quantum Metrology with a Scanning Probe Atom Interferometer

✍ Scribed by Ockeloen, Caspar F.; Schmied, Roman; Riedel, Max F.; Treutlein, Philipp

Book ID: 121287654
Publisher: The American Physical Society
Year: 2013
Tongue: English
Weight: 773 KB
Volume: 111
Category: Article
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.111.143001

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