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Quantum measurements of trapped ions

โœ Scribed by W.M. Itano; J.C. Bergquist; J.J. Bollinger; J.M. Gilligan; D.J. Heinzen; F.L. Moore; M.G. Raizen; D.J. Wineland


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
783 KB
Volume
37
Category
Article
ISSN
0083-6656

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โœ D.J. Wineland; D. Leibfried ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 412 KB

The use of trapped atomic ions in the field of quantum information processing is briefly reviewed. We summarize the basic mechanisms required for logic gates and the use of the gates in demonstrating simple algorithms. We discuss the potential of trapped ions to reach fault-tolerant error levels in