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Quantitative tomographic X-ray profiling of non-Bragg diffracting materials using phase retrieval X-ray diffractometry

✍ Scribed by A.Y. Nikulin; R.B. Horney; A.V. Darahanau; I.D. Svalbe; T. Bigault; E. Ziegler

No coin nor oath required. For personal study only.

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