Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials

✍ Scribed by A.V. Darahanau; A.Y. Nikulin; A. Souvorov; Y. Nishino; B.C. Muddle; T. Ishikawa

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 364 KB
• Volume: 251
• Category: Article
• ISSN: 0030-4018
• DOI: 10.1016/j.optcom.2005.02.071