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Quantitative studies of beam-induced defects in III–V compounds by cathodoluminescence and transmission electron microscopy

✍ Scribed by D.B. Holt; E. Napchan; L. Lazzarini; M. Urchulutegui; G. Salviati

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 688 KB
Volume: 24
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(94)90313-1

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