✦ LIBER ✦

Quantitative Rutherford backscattering spectrometry in-depth composition analysis of sputtered TaSi2 layers

✍ Scribed by J. Schulte; R. Ferretti; W. Hasse; Y. Danto; Y. Ousten

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Compositional analysis of atom beam co-s

✍ Hardeep Kumar; Y.K. Mishra; S. Mohapatra; D. Kabiraj; J.C. Pivin; S. Ghosh; D.K. 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 432 KB

Characterization of Ta2O5 layers by elec

✍ K. Gu¨rtler; K. Bange; W. Wagner; F. Rauch; H. Hantsche 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 233 KB