๐”– Bobbio Scriptorium
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Quantitative modelling in scanning probe microscopy

โœ Scribed by A.S. Foster; W.A. Hofer; A.L. Shluger


Book ID
117756849
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
305 KB
Volume
5
Category
Article
ISSN
1359-0286

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Quantitative Data Processing in Scanning
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Accurate measurement at the nano-scale โ€“ nanometrology โ€“ is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture