Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction

✍ Scribed by Mittereder, J.A.; Roussos, J.A.; Anderson, W.T.; Ioannou, D.E.

• Book ID: 114668156
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 518 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/tr.2002.804487