[JEDC Solid State Technol. Assoc 1999 GaAs Reliability Workshop. Proceedings - Monterey, CA, USA (17 Oct. 1999)] 1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) - Channel temperature measurement of GaAs devices using an atomic force microscope

✍ Scribed by Anderson, W.T.; Mittereder, J.A.; Roussos, J.A.

• Book ID: 126732084
• Publisher: JEDC Solid State Technol. Assoc
• Year: 1999
• Tongue: English
• Weight: 545 KB
• Category: Article
• ISBN-13: 9780790801001
• DOI: 10.1109/GAASRW.1999.874092