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Quantitative electron-probe microanalysis of thin layers

✍ Scribed by Gartzman, K. G. ;Dedegkaev, T. T. ;Efimov, A. N.

Book ID: 105116075
Publisher: Springer-Verlag
Year: 1983
Weight: 279 KB
Volume: 81
Category: Article
ISSN: 0344-838X
DOI: 10.1007/bf01202678

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