Quantitative depth profiling with AES: application to oxide layers of NiCrFe alloys

✍ Scribed by J. Steffen; S. Hofmann

• Book ID: 112376590
• Publisher: Springer
• Year: 1989
• Tongue: English
• Weight: 195 KB
• Volume: 333
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/bf00572338