Characterization of oxide layers on amorphous Mg-based alloys by Auger electron spectroscopy with sputter depth profiling

✍ Scribed by S. Baunack; R. V. Subba Rao; U. Wolff

• Book ID: 105888101
• Publisher: Springer
• Year: 2003
• Tongue: English
• Weight: 321 KB
• Volume: 375
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/s00216-003-1787-3