✦ LIBER ✦

Quantitative Auger analysis of ion-implanted boron and arsenic in polycrystalline silicon

✍ Scribed by K Fujiwara; M Ohtani; K Kanayama; H Ogata

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Quantitative distribution analysis for b

✍ Grasserbauer, M. ;Stingeder, G. ;Guerrero, E. ;Fallmann, W. 📂 Article 📅 1981 🏛 Springer-Verlag ⚖ 576 KB

Thermal Diffusion of Ion-Implanted Arsen

✍ Tsukamoto, Katsuhiro; Akasaka, Yoichi; Kijima, Koichi 📂 Article 📅 1980 🏛 Institute of Pure and Applied Physics 🌐 English ⚖ 963 KB

MeV backscattering analysis of annealing

✍ T. Inada; H. Miyakawa; T. Ohfuji; K. Benzaki; H. Onoda; Y. Yuge; S. Ushio 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 366 KB

Ellipsometric analysis of ion-implanted

✍ Emmanouil Lioudakis; Androula Nassiopoulou; Andreas Othonos 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 244 KB

Instrumental Neutron Activation Analysis

✍ R. R. Greenberg; R. M. Lindstrom; D. S. Simons 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 131 KB

Interaction effects between arsenic and

✍ Li Guohui; Ma Yi; Zhang Tonghe; Luo Yan 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 366 KB