Quantitative analysis of the AuNi(111) system by XPS: separation of peaks and background subtraction

Quantitative analysis of overlapping XPS

Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide films

✍ Graat, Peter; Somers, Marcel A. J. 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 333 KB 👁 2 views

The composition and thickness of thin iron oxide Ðlms on polycrystalline pure iron were evaluated from Fe 2p spectra as measured by x-ray photoelectron spectroscopy. To this end the experimental spectra were reconstructed from reference spectra of the constituents Fe0, Fe2' and Fe3'. The background